This allows bonded lap shears to be pulled to failure at different temperatures and also allows for testing of different components that need to be exposed to a range of temperatures. The Polymer Laboratory has the capability of performing tensile, lap shear, and/or compressive testing of materials and structural components at elevated or cold temperatures. The resulting EDS spectrum is used to identify the element. EDS operates by collecting the energy received back from the excited electrons as they drop back to lower energy electron shells and converting the energy to a digital pulse. This capability is used for identifying the composition of metallic alloys, contamination and coatings. Both SEM instruments are also outfitted with energy dispersive spectrometry (EDS) that allows the determination of the elements of the sample. The Hitachi SEM, has the capability of producing high resolution images at low accelerating voltages that enable the more difficult examination of nonmetallic and nonconductive specimens like nanotubes. Carbon and Precious Metal Thermal /Sputter Coaters.Scanning Transmission Electron Microscopy (STEM).Electron Backscatter Diffraction (EBSD).The SEM contains a Cold Field Emission SEM (Hitachi S-4800) and a Variable Pressure Schottky SEM (Zeiss Supra 55VP) capable of imaging electrically conductive and non-conductive specimens to 1 nm resolution. Scanning Electron Microscopy Laboratory (SEM) Scanning Electron Microscopy Laboratory We provide analytical capabilities used in the analysis and evaluation of space flight hardware, failure analysis of flight and non-flight hardware, materials properties testing and advanced materials development. The MEL is staffed with scientists, engineers, and technologists who have degrees and expertise in:
HITACHI S 4800 SEM PROBE CURRENT RANGE SOFTWARE
HP Interactive Measurement and Analysis (IMA) Software makes measurements interactively by providing a softpanel user interface.The Materials Evaluation Laboratories (MEL) provide science and engineering services to Johnson Space Center (JSC), industrial organizations, NASA and other government agencies, educational and research institutions including those supporting NASA spaceflight and technology development programs. HP BASIC, with all the elements of HP-UX, the Hewlett-Packard implementation of the AT&T System V UNIX* operating system. HP BASIC/UX combines the most powerful instrument control language. In addition to the sophisticated hardware of the HP4062C, the HP4062UX provides powerful software capabilities with the HP BASIC/UX operating environment.
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For example, a typical connect-connect-force-measure sequence (resistance) measurement takes less than 17 ms, and measurements can range from 20 fA to lA and 4 ¦ÌV to 200V.
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Since the HP4062UX uses the same measurement hardware as the HP4062C, it maintains the same highly accurate and reliable measurement capabilities as the HP4062C, such as high-speed measurements over a wide measurement range. The HP4062UX satisfies all of the requirements of the Integrated Circuit Manufacturers for both process monitoring and process development. The HP4062UX Semiconductor Process Control System is the high-end system of the HP4062 Semiconductor Parametric Test System family. Please contact us by for more information. Electronic Tester > HP 4062UX Semiconductor Process Control System